Residual stress measurements with X-ray diffraction, XRD
X-ray diffraction is a fast and accurate method to to determine the residual stress state in the surface of all types of material with a crystalline microstructure. The most common material we measure is steel, but also other metals and alloys.
Stresstech’s Xstress-equipments are special designed to only measure residual stresses, but also the content of retained austenite in steel. The depth of analysis is appr. 5-10 micron.
We can make residual stress depth profiles below the surface, with the help of electrolytic polishing (not affecting the stresses).
Please contact us for more information.
